An international team of authors, including Hans-Christian Hege (ZIB), received a Best Poster Award for its contribution entitled "Tools for the Analysis of Datasets from Computed Tomography Based on Talbot Lau Grating Interferometryā€¯ at the ICT2019 - 9th International Conference on Industrial Computed Tomography in Padova (Italy). The winners were determined by a vote of the conference audience.